Hasil Pencarian - Osbert Cheng

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  1. 1
    An Experimental Approach to Characterizing the Channel Local Temperature Induced by Self-Heating Effect in FinFET

    An Experimental Approach to Characterizing the Channel Local Temperature Induced by Self-Heating Effect in FinFET oleh E Ray Hsieh, Meng-Ru Jiang, Jian-Li Lin, Steve S. Chung, Tse Pu Chen, Shih An Huang, Tai-Ju Chen, Osbert Cheng

    Diterbitkan 2018-01-01
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  2. 2
    Significance of Overdrive Voltage in the Analysis of Short-Channel Behaviors of n-FinFET Devices

    Significance of Overdrive Voltage in the Analysis of Short-Channel Behaviors of n-FinFET Devices oleh Yi-Chuen Eng, Luke Hu, Tzu-Feng Chang, Chih-Yi Wang, Steven Hsu, Osbert Cheng, Chien-Ting Lin, Yu-Shiang Lin, Zen-Jay Tsai, Chih-Wei Yang, Jim Lu, Steve Yi-Wen Chen

    Diterbitkan 2022-01-01
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  3. 3
    Monitoring of FinFET Characteristics Using <inline-formula> <tex-math notation="LaTeX">$\Delta V_{\text{DIBLSS}}/(I_{\text{on}}/I_{\text{off}})$ </tex-math></inline-formula> and <inline-formula> <tex-math notation="LaTeX">$\Delta V_{\text{DIBL}}/(I_{\text{on}}/I_{\text{off}})$ </tex-math></inline-formula>

    Monitoring of FinFET Characteristics Using <inline-formula> <tex-math notation="LaTeX">$\Delta V_{\text{DIBLSS}}/(I_{\text{on}}/I_{\text{off}})$ </tex-math></inline-formula> and <i... oleh Yi-Chuen Eng, Luke Hu, Tzu-Feng Chang, Chih-Yi Wang, Steven Hsu, Osbert Cheng, Chien-Ting Lin, Yu-Shiang Lin, Zen-Jay Tsai, Ted Wang, Touber Tseng, Chih-Wei Yang, Chin-Yang Hsieh

    Diterbitkan 2019-01-01
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  4. 4
    An Investigation of Anode Hole Injection-Induced Abnormal Body Current in n-Channel HfO<sub>2</sub>/TiN MOSFETs

    An Investigation of Anode Hole Injection-Induced Abnormal Body Current in n-Channel HfO<sub>2</sub>/TiN MOSFETs oleh Jih-Chien Liao, Ting-Chang Chang, Wei-Ren Syong, Kai-Chun Chang, Ying-Hsin Lu, Hsi-Wen Liu, Chien-Yu Lin, Li-Hui Chen, Fu-Yuan Jin, Yu-Hsuan Chen, Chen-Hsin Lien, Osbert Cheng, Cheng-Tung Huang, Yi-Han Ye

    Diterbitkan 2018-01-01
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  5. 5
    Importance of $\Delta V_{{\text {DIBLSS}}}/({I}_{{\text {on}}} /{I}_{{\text {off}}})$ in Evaluating the Performance of n-Channel Bulk FinFET Devices

    Importance of $\Delta V_{{\text {DIBLSS}}}/({I}_{{\text {on}}} /{I}_{{\text {off}}})$ in Evaluating the Performance of n-Channel Bulk FinFET Devices oleh Yi-Chuen Eng, Luke Hu, Tzu-Feng Chang, Steven Hsu, Chun Mao Chiou, Ted Wang, Chih-Wei Yang, Osbert Cheng, Chih-Yi Wang, C. S. Tseng, Ren Huang, Po-Hsieh Lin, Kuan-Yu Lu, I-Fan Chang, Chi-Ju Lee, Yen-Liang Wu, Mike Chang

    Diterbitkan 2018-01-01
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  6. 6
    A New Figure of Merit, ${\Delta V_{\text {DIBLSS}} /(I_{\rm {d},{\mathrm{ sat}}} /I_{\rm {sd},{\mathrm{ leak}}} )}$ , to Characterize Short-Channel Performance of a Bulk-Si n-Channel FinFET Device

    A New Figure of Merit, ${\Delta V_{\text {DIBLSS}} /(I_{\rm {d},{\mathrm{ sat}}} /I_{\rm {sd},{\mathrm{ leak}}} )}$ , to Characterize Short-Channel Performance of a Bulk-Si n-Chann... oleh Yi-Chuen Eng, Luke Hu, Tzu-Feng Chang, Steven Hsu, Chun Mao Chiou, Ted Wang, Chih-Wei Yang, Chien-Ting Lin, I-Chang Wang, Ming-Chih Chen, Andy Lai, Pei-Wen Wang, Chia-Jung Hsu, Wen-Yuan Pang, Chin-Hao Kuo, Osbert Cheng, Chih-Yi Wang

    Diterbitkan 2017-01-01
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