Hasil Pencarian - Nabil Anwer

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  1. 1
    Tolerancing Informatics: Towards Automatic Tolerancing Information Processing in Geometrical Variations Management

    Tolerancing Informatics: Towards Automatic Tolerancing Information Processing in Geometrical Variations Management oleh Benjamin Schleich, Nabil Anwer

    Diterbitkan 2020-12-01
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  2. 2
    Point-by-Point-Contact-Based Approach to Compute Position and Orientation between Parts Assembled by Multiple Non-Ideal Planes

    Point-by-Point-Contact-Based Approach to Compute Position and Orientation between Parts Assembled by Multiple Non-Ideal Planes oleh Jian Zhang, Lihong Qiao, Zhicheng Huang, Nabil Anwer

    Diterbitkan 2022-11-01
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  3. 3
    Measurement and uncertainty determination during inspection of free form profiles

    Measurement and uncertainty determination during inspection of free form profiles oleh Antonio Piratelli Filho, Nabil Anwer Anwer, Rosenda Valdéz Arencibia

    Diterbitkan 2012-12-01
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  4. 4
    Measurement and uncertainty determination during inspection of free form profiles

    Measurement and uncertainty determination during inspection of free form profiles oleh Antonio Piratelli Filho, Nabil Anwer Anwer, Rosenda Valdéz Arencibia

    Diterbitkan 2012-12-01
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  5. 5
    Geometric tolerance and manufacturing assemblability estimation of metal additive manufacturing (AM) processes

    Geometric tolerance and manufacturing assemblability estimation of metal additive manufacturing (AM) processes oleh Baltej Singh Rupal, Nabil Anwer, Marc Secanell, Ahmed Jawad Qureshi

    Diterbitkan 2020-09-01
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  6. 6
    Generation of Reference Softgauges for Minimum Zone Fitting Algorithms: Case of Aspherical and Freeform Surfaces

    Generation of Reference Softgauges for Minimum Zone Fitting Algorithms: Case of Aspherical and Freeform Surfaces oleh Amine Chiboub, Yassir Arezki, Alain Vissiere, Charyar Mehdi-Souzani, Nabil Anwer, Bandar Alzahrani, Mohamed Lamjed Bouazizi, Hichem Nouira

    Diterbitkan 2021-12-01
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  7. 7
    Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer Level

    Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer Level oleh Yassir Arezki, Rong Su, Ville Heikkinen, François Leprete, Pavel Posta, Youichi Bitou, Christian Schober, Charyar Mehdi-Souzani, Bandar Abdulrahman Mohammed Alzahrani, Xiangchao Zhang, Yohan Kondo, Christof Pruss, Vit Ledl, Nabil Anwer, Mohamed Lamjed Bouazizi, Richard Leach, Hichem Nouira

    Diterbitkan 2021-02-01
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