Hasil Pencarian - Matthias Temmen

  • Menampilkan 1 - 5 hasil dari 5
Perbaiki Hasil
  1. 1
    Noise in NC-AFM measurements with significant tip–sample interaction

    Noise in NC-AFM measurements with significant tip–sample interaction oleh Jannis Lübbe, Matthias Temmen, Philipp Rahe, Michael Reichling

    Diterbitkan 2016-12-01
    Dapatkan teks lengkap
    Artikel
    Simpan ke Daftar
    Disimpan di:
  2. 2
    Understanding interferometry for micro-cantilever displacement detection

    Understanding interferometry for micro-cantilever displacement detection oleh Alexander von Schmidsfeld, Tobias Nörenberg, Matthias Temmen, Michael Reichling

    Diterbitkan 2016-06-01
    Dapatkan teks lengkap
    Artikel
    Simpan ke Daftar
    Disimpan di:
  3. 3
    Determining cantilever stiffness from thermal noise

    Determining cantilever stiffness from thermal noise oleh Jannis Lübbe, Matthias Temmen, Philipp Rahe, Angelika Kühnle, Michael Reichling

    Diterbitkan 2013-03-01
    Dapatkan teks lengkap
    Artikel
    Simpan ke Daftar
    Disimpan di:
  4. 4
    Improving Eye-Tracking Data Quality: A Framework for Reproducible Evaluation of Detection Algorithms

    Improving Eye-Tracking Data Quality: A Framework for Reproducible Evaluation of Detection Algorithms oleh Christopher Gundler, Matthias Temmen, Alessandro Gulberti, Monika Pötter-Nerger, Frank Ückert

    Diterbitkan 2024-04-01
    Dapatkan teks lengkap
    Artikel
    Simpan ke Daftar
    Disimpan di:
  5. 5
    Thermal noise limit for ultra-high vacuum noncontact atomic force microscopy

    Thermal noise limit for ultra-high vacuum noncontact atomic force microscopy oleh Jannis Lübbe, Matthias Temmen, Sebastian Rode, Philipp Rahe, Angelika Kühnle, Michael Reichling

    Diterbitkan 2013-01-01
    Dapatkan teks lengkap
    Artikel
    Simpan ke Daftar
    Disimpan di:

Alat Pencarian: