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    Ultrafast perturbation maps as a quantitative tool for testing of multi-port photonic devices

    Ultrafast perturbation maps as a quantitative tool for testing of multi-port photonic devices oleh Kevin Vynck, Nicholas J. Dinsdale, Bigeng Chen, Roman Bruck, Ali Z. Khokhar, Scott A. Reynolds, Lee Crudgington, David J. Thomson, Graham T. Reed, Philippe Lalanne, Otto L. Muskens

    Diterbitkan 2018-06-01
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