Multiple machine learning approach to characterize two-dimensional nanoelectronic devices via featurization of charge fluctuation oleh Kookjin Lee, Sangjin Nam, Hyunjin Ji, Junhee Choi, Jun-Eon Jin, Yeonsu Kim, Junhong Na, Min-Yeul Ryu, Young-Hoon Cho, Hyebin Lee, Jaewoo Lee, Min-Kyu Joo, Gyu-Tae Kim