Hasil Pencarian - Jiangkun Sheng

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  1. 1
    Dose rate effects on array CCDs exposed by Co-60 γ rays induce saturation output degradation and annealing tests

    Dose rate effects on array CCDs exposed by Co-60 γ rays induce saturation output degradation and annealing tests oleh Zujun Wang, Wei Chen, Baoping He, Zhibin Yao, Zhigang Xiao, Jiangkun Sheng, Minbo Liu

    Diterbitkan 2015-10-01
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  2. 2
    Combined reactor neutron beam and 60Co γ-ray radiation effects on CMOS APS image sensors

    Combined reactor neutron beam and 60Co γ-ray radiation effects on CMOS APS image sensors oleh Zujun Wang, Wei Chen, Jiangkun Sheng, Yan Liu, Zhigang Xiao, Shaoyan Huang, Minbo Liu

    Diterbitkan 2015-02-01
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  3. 3
    Displacement damage effects on CMOS APS image sensors induced by neutron irradiation from a nuclear reactor

    Displacement damage effects on CMOS APS image sensors induced by neutron irradiation from a nuclear reactor oleh Zujun Wang, Shaoyan Huang, Minbo Liu, Zhigang Xiao, Baoping He, Zhibin Yao, Jiangkun Sheng

    Diterbitkan 2014-07-01
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  4. 4
    Theoretical and experimental study of the dark signal in CMOS image sensors affected by neutron radiation from a nuclear reactor

    Theoretical and experimental study of the dark signal in CMOS image sensors affected by neutron radiation from a nuclear reactor oleh Yuanyuan Xue, Zujun Wang, Baoping He, Zhibin Yao, Minbo Liu, Wuying Ma, Jiangkun Sheng, Guantao Dong, Junshan Jin

    Diterbitkan 2017-12-01
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  5. 5
    Characterization of total ionizing dose damage in COTS pinned photodiode CMOS image sensors

    Characterization of total ionizing dose damage in COTS pinned photodiode CMOS image sensors oleh Zujun Wang, Wuying Ma, Shaoyan Huang, Zhibin Yao, Minbo Liu, Baoping He, Jing Liu, Jiangkun Sheng, Yuan Xue

    Diterbitkan 2016-03-01
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  6. 6
    Bit upset and performance degradation of NAND flash memory induced by total ionizing dose effects

    Bit upset and performance degradation of NAND flash memory induced by total ionizing dose effects oleh Jiangkun Sheng, Peng Xu, Mengtong Qiu, Yinhong Luo, Lili Ding, Zhibin Yao, Baoping He, Shilong Gou, Wuying Ma

    Diterbitkan 2023-04-01
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  7. 7
    Proton Radiation Effects on Dark Signal Distribution of PPD CMOS Image Sensors: Both TID and DDD Effects

    Proton Radiation Effects on Dark Signal Distribution of PPD CMOS Image Sensors: Both TID and DDD Effects oleh Yuanyuan Xue, Zujun Wang, Wei Chen, Minbo Liu, Baoping He, Zhibin Yao, Jiangkun Sheng, Wuying Ma, Guantao Dong, Junshan Jin

    Diterbitkan 2017-11-01
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  8. 8
    Estimation method for bit upset ratio of NAND flash memory induced by heavy ion irradiation

    Estimation method for bit upset ratio of NAND flash memory induced by heavy ion irradiation oleh Jiangkun Sheng, Mengtong Qiu, Peng Xu, Lili Ding, Yinhong Luo, Zhibin Yao, Fengqi Zhang, Shilong Gou, Zujun Wang, Yuanyuan Xue

    Diterbitkan 2024-02-01
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