Hasil Pencarian - Hassan Gargouri

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  1. 1
    An Integrated Evanescent Field Sensor for the Simultaneous Measurement of Layer Refractive Index and Thickness

    An Integrated Evanescent Field Sensor for the Simultaneous Measurement of Layer Refractive Index and Thickness oleh Matthias Jäger, Jürgen Bruns, Jessica Schneidewind, Cay Pinnow, Hassan Gargouri, Klaus Petermann

    Diterbitkan 2021-02-01
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  2. 2
    Ellipsometry and XPS comparative studies of thermal and plasma enhanced atomic layer deposited Al2O3-films

    Ellipsometry and XPS comparative studies of thermal and plasma enhanced atomic layer deposited Al2O3-films oleh Jörg Haeberle, Karsten Henkel, Hassan Gargouri, Franziska Naumann, Bernd Gruska, Michael Arens, Massimo Tallarida, Dieter Schmeißer

    Diterbitkan 2013-11-01
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  3. 3
    On the Conduction Properties of Vertical GaN n-Channel Trench MISFETs

    On the Conduction Properties of Vertical GaN n-Channel Trench MISFETs oleh Eldad Bahat Treidel, Oliver Hilt, Veit Hoffmann, Frank Brunner, Nicole Bickel, Andreas Thies, Kornelius Tetzner, Hassan Gargouri, Christian Huber, Konstanty Donimirski, Joachim Wurfl

    Diterbitkan 2021-01-01
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