Extended-depth of field random illumination microscopy, EDF-RIM, provides super-resolved projective imaging oleh Lorry Mazzella, Thomas Mangeat, Guillaume Giroussens, Benoit Rogez, Hao Li, Justine Creff, Mehdi Saadaoui, Carla Martins, Ronan Bouzignac, Simon Labouesse, Jérome Idier, Frédéric Galland, Marc Allain, Anne Sentenac, Loïc LeGoff