X-ray Based in Situ Investigation of Silicon Growth Mechanism Dynamics—Application to Grain and Defect Formation oleh Hadjer Ouaddah, Maike Becker, Thècle Riberi-Béridot, Maria Tsoutsouva, Vasiliki Stamelou, Gabrielle Regula, Guillaume Reinhart, Isabelle Périchaud, Fabrice Guittonneau, Laurent Barrallier, Jean-Paul Valade, Alexander Rack, Elodie Boller, José Baruchel, Nathalie Mangelinck-Noël