Hasil Pencarian - François Piquemal

  • Menampilkan 1 - 4 hasil dari 4
Perbaiki Hasil
  1. 1
    Progress in Traceable Nanoscale Capacitance Measurements Using Scanning Microwave Microscopy

    Progress in Traceable Nanoscale Capacitance Measurements Using Scanning Microwave Microscopy oleh François Piquemal, José Morán-Meza, Alexandra Delvallée, Damien Richert, Khaled Kaja

    Diterbitkan 2021-03-01
    Dapatkan teks lengkap
    Artikel
    Simpan ke Daftar
    Disimpan di:
  2. 2
    A multi-resistance wide-range calibration sample for conductive probe atomic force microscopy measurements

    A multi-resistance wide-range calibration sample for conductive probe atomic force microscopy measurements oleh François Piquemal, Khaled Kaja, Pascal Chrétien, José Morán-Meza, Frédéric Houzé, Christian Ulysse, Abdelmounaim Harouri

    Diterbitkan 2023-11-01
    Dapatkan teks lengkap
    Artikel
    Simpan ke Daftar
    Disimpan di:
  3. 3
    Traceable Nanoscale Measurements of High Dielectric Constant by Scanning Microwave Microscopy

    Traceable Nanoscale Measurements of High Dielectric Constant by Scanning Microwave Microscopy oleh Damien Richert, José Morán-Meza, Khaled Kaja, Alexandra Delvallée, Djamel Allal, Brice Gautier, François Piquemal

    Diterbitkan 2021-11-01
    Dapatkan teks lengkap
    Artikel
    Simpan ke Daftar
    Disimpan di:
  4. 4
    3D Imaging and Quantitative Subsurface Dielectric Constant Measurement Using Peak Force Kelvin Probe Force Microscopy

    3D Imaging and Quantitative Subsurface Dielectric Constant Measurement Using Peak Force Kelvin Probe Force Microscopy oleh Khaled Kaja, Ammar Assoum, Peter De Wolf, François Piquemal, Antonio Nehmee, Adnan Naja, Taha Beyrouthy, Mustapha Jouiad

    Diterbitkan 2024-01-01
    Dapatkan teks lengkap
    Artikel
    Simpan ke Daftar
    Disimpan di:

Alat Pencarian: