Hasil Pencarian - David Martrou

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  1. 1
    In-situ NC-AFM measurements of high quality AlN(0001) layers grown at low growth rate on 4H-SiC(0001) and Si(111) substrates using ammonia molecular beam epitaxy

    In-situ NC-AFM measurements of high quality AlN(0001) layers grown at low growth rate on 4H-SiC(0001) and Si(111) substrates using ammonia molecular beam epitaxy oleh Florian Chaumeton, Sébastien Gauthier, David Martrou

    Diterbitkan 2015-06-01
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  2. 2
    An NC-AFM and KPFM study of the adsorption of a triphenylene derivative on KBr(001)

    An NC-AFM and KPFM study of the adsorption of a triphenylene derivative on KBr(001) oleh Antoine Hinaut, Adeline Pujol, Florian Chaumeton, David Martrou, André Gourdon, Sébastien Gauthier

    Diterbitkan 2012-03-01
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