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    Electron-beam-induced current measurements with applied bias provide insight to locally resolved acceptor concentrations at p-n junctions

    Electron-beam-induced current measurements with applied bias provide insight to locally resolved acceptor concentrations at p-n junctions oleh D. Abou-Ras, N. Schäfer, N. Baldaz, S. Brunken, C. Boit

    Diterbitkan 2015-07-01
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