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    Measurement of carrier lifetime in micron-scaled materials using resonant microwave circuits

    Measurement of carrier lifetime in micron-scaled materials using resonant microwave circuits oleh Sukrith Dev, Yinan Wang, Kyounghwan Kim, Marziyeh Zamiri, Clark Kadlec, Michael Goldflam, Samuel Hawkins, Eric Shaner, Jin Kim, Sanjay Krishna, Monica Allen, Jeffery Allen, Emanuel Tutuc, Daniel Wasserman

    Diterbitkan 2019-04-01
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