Hasil Pencarian - CUI Jiangwei

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  1. 1
    Damage law and mechanism of total dose of PDSOI transistors with different channel lengths caused by backgate bias

    Damage law and mechanism of total dose of PDSOI transistors with different channel lengths caused by backgate bias oleh WANG Haiyang, ZHENG Qiwen, CUI Jiangwei, LI Yudong, GUO Qi

    Diterbitkan 2022-05-01
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  2. 2
    Static and Dynamic Radiation Damage of Silicon Carbide VDMOS and Their Comparison

    Static and Dynamic Radiation Damage of Silicon Carbide VDMOS and Their Comparison oleh FENG Haonan;YANG Sheng;LIANG Xiaowen;ZHANG Dan;PU Xiaojuan;SUN Jing;WEI Ying;CUI Jiangwei;LI Yudong;YU Xuefeng;GUO Qi

    Diterbitkan 2022-04-01
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