Hasil Pencarian - C. Boit

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  1. 1
    Electron-beam-induced current measurements with applied bias provide insight to locally resolved acceptor concentrations at p-n junctions

    Electron-beam-induced current measurements with applied bias provide insight to locally resolved acceptor concentrations at p-n junctions oleh D. Abou-Ras, N. Schäfer, N. Baldaz, S. Brunken, C. Boit

    Diterbitkan 2015-07-01
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  2. 2
    Physical IC debug ─ backside approach and nanoscale challenge

    Physical IC debug ─ backside approach and nanoscale challenge oleh U. Kerst, T. Kiyan, U. Kindereit, A. Glowacki, R. Schlangen, C. Boit, T. Lundquist, S. Kasapi, H. Suzuki

    Diterbitkan 2008-05-01
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