Hasil Pencarian - Andreas N. Danilewsky

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  1. 1
    Real-time direct and diffraction X-ray imaging of irregular silicon wafer breakage

    Real-time direct and diffraction X-ray imaging of irregular silicon wafer breakage oleh Alexander Rack, Mario Scheel, Andreas N. Danilewsky

    Diterbitkan 2016-03-01
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  2. 2
    Quantitative Imaging of the Stress/Strain Fields and Generation of Macroscopic Cracks from Indents in Silicon

    Quantitative Imaging of the Stress/Strain Fields and Generation of Macroscopic Cracks from Indents in Silicon oleh Brian K. Tanner, David Allen, Jochen Wittge, Andreas N. Danilewsky, Jorge Garagorri, Eider Gorostegui-Colinas, M. Reyes Elizalde, Patrick J. McNally

    Diterbitkan 2017-11-01
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  3. 3
    Large-Scale Defect Clusters with Hexagonal Honeycomb-like Arrangement in Ammonothermal GaN Crystals

    Large-Scale Defect Clusters with Hexagonal Honeycomb-like Arrangement in Ammonothermal GaN Crystals oleh Lutz Kirste, Thu Nhi Tran Thi Caliste, Jan L. Weyher, Julita Smalc-Koziorowska, Magdalena A. Zajac, Robert Kucharski, Tomasz Sochacki, Karolina Grabianska, Malgorzata Iwinska, Carsten Detlefs, Andreas N. Danilewsky, Michal Bockowski, José Baruchel

    Diterbitkan 2022-10-01
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